By Frank L. Chan (auth.), E. L. Grove, Alfred J. Perkins (eds.)
Volume 7 of advancements in utilized Spectroscopy is a set of forty-two papers chosen from those who have been offered on the seventh nationwide assembly of the Society of utilized Spectroscopy, held (in position of the nineteenth Mid-America Symposium on Spectroscopy) in Chicago, may perhaps 13-17, 1968. those papers, chosen by means of the editors and reviewed via individuals an expert within the box, are these of the symposium style and never these referring to particular study subject matters that one might count on to be submitted to a magazine. it's the opinion of the committee that this kind of ebook has an incredible position within the literature. The really huge variety of papers could bring about really a large quantity if certain in a single set of covers. therefore, and to offer the cloth in components of extra particular mterest, quantity 7 was once divided into components, half A, Physical-Inorganic, and half B, Physical-Organic advancements. The seventh nationwide assembly was once subsidized by means of the Chicago part as host in cooperation with the St. Louis, New England, Penn York, Niagara-Frontier, Cincinnati, Ohio Valley, ny, Baltimore-Washington, North Texas, Rocky Mountain, and Southeastern Sections of the Society for utilized Spectroscopy and the Chicago fuel Chromatography team. The editors desire to exhibit their appreciation to the authors and to people who helped with the reviewing. The latter comprise Dr. Elma Lanterman, Mr. John E. Forrette, Dr. Carl Moore, Dr. B. Jaselskis, Mr. H. G. Zelinski, Mr.
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Extra info for Developments in Applied Spectroscopy: Selected papers from the Seventh National Meeting of the Society for Applied Spectroscopy (Nineteenth Annual Mid-America Spectroscopy Symposium) Held in Chicago, Illinois, May 13–17, 1968
PINK 34 crystal reduce the primary extinction of x-rays and show up as images of enhanced intensity (dark regions on the emulsion). The scanning-transmission or Lang method has been widely used for the study of crystal bulk defects using hard radiation such as that from Mo or Ag. Table II gives the Bragg angles for Cr, Cu, and Mo Ka radiation for low-index planes in silicon. The low absorption coefficient and the small Bragg angle of the hard x-rays make these ideal for transmission application.
C g UI u Thickness in Microns Fig. 11. Comparison of conventional and nondispersive x-ray fluorescence methods for the determination of film thickness for cadmium selenide. Conditions: Upper graph-Mo target; no PHS; air path; 60 kVp, 10 rnA; analyzing crystal, LiF; scintillation counter. Lower graph-Radioisotope, dysprosium-159; PHA channels 200; total counting time, 4 min; lithium-drifted silicon detector. 24 FRANK L. CHAN ~8....... , I III .... +' ~ :> Iiu +' QI c: g u = ... o:: P.. • III :..
Such an instrument is well adapted to film-thickness measurement. Many of the difficulties encountered in other methods such as the matrix effect, the question of inhomogeneity, particle size, and many kindred phenomena do not enter here in dealing with film thickness of II-VI compounds. ACKNOWLEDGMENTS The author would like to thank Dr. W. Barclay Jones, formerly of the Technical Measurement Corporation and now a Professor at Yale University, for assistance with the measurements using the photon spectrometer.